JOPSS - Search Results

Journal Articles

Ionoluminescence analysis of glass scintillators and application to single-ion-hit real-time detection

Yokoyama, Akihito; Kada, Wataru*; Sato, Takahiro; Koka, Masashi; Shimada, Keisuke*; Yokota, Yuya*; Miura, Kenta*; Hanaizumi, Osamu*

Nuclear Instruments and Methods in Physics Research B, 371, p.340 - 343, 2016/03

https://doi.org/10.1016/j.nimb.2015.10.024

Times Cited Count：6 Percentile：49.29(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Development and actual condition of 100MeV class heavy ion microbeam system at JAERI Takasaki, 2

Oikawa, Masakazu*; Sato, Takahiro; Sakai, Takuro; Fukuda, Mitsuhiro; Okumura, Susumu; Miyawaki, Nobumasa; Kurashima, Satoshi; Nara, Takayuki; Yokota, Wataru; Kamiya, Tomihiro

Dai-18-Kai Tandemu Kasokuki Oyobi Sono Shuhen Gijutsu No Kenkyukai Hokokushu, p.99 - 102, 2005/11

no abstracts in English

Journal Articles

Heavy-ion induced current in MOS structure

Takahashi, Yoshihiro*; Shibata, Toshihiko*; Murase, Yuji*; Onishi, Kazunori*; Hirao, Toshio; Kamiya, Tomihiro

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.111 - 114, 2004/10

no abstracts in English

Journal Articles

Effect of damage on transient current waveform observed in GaAs schottky diode by single ion hit

Hirao, Toshio; Laird, J. S.; Onoda, Shinobu; Wakasa, Takeshi; Ito, Hisayoshi

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.187 - 189, 2004/10

no abstracts in English

Journal Articles

Development of single-ion hit techniques and their applications at TIARA of JAERI Takasaki

Kamiya, Tomihiro; Hirao, Toshio; Kobayashi, Yasuhiko

Nuclear Instruments and Methods in Physics Research B, 219-220, p.1010 - 1014, 2004/06

https://doi.org/10.1016/j.nimb.2004.01.205

Times Cited Count：8 Percentile：48.81(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Observation of single-ion induced charge collection in diode by a heavy ion microbeam system

Kamiya, Tomihiro; Oikawa, Masakazu*; Oshima, Takeshi; Hirao, Toshio; Lee, K. K.; Onoda, Shinobu*; Laird, J. S.

Nuclear Instruments and Methods in Physics Research B, 210, p.206 - 210, 2003/09

https://doi.org/10.1016/S0168-583X(03)01071-1

Times Cited Count：1 Percentile：12.51(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Present status and prospect of microbeams at TIARA

Watanabe, Hiroshi; Sudo, Yukio

Nuclear Instruments and Methods in Physics Research B, 210, p.1 - 5, 2003/09

https://doi.org/10.1016/S0168-583X(03)00999-6

Times Cited Count：4 Percentile：33.69(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Development of an atomated single cell irradiation system combined with a high-energy heavy ion microbeam system

Kamiya, Tomihiro; Yokota, Wataru; Kobayashi, Yasuhiko; Cholewa, M.*; Krochmal, M. S.*; Laken, G.*; Larsen, I. D.*; Fiddes, L.*; Parkhill, G.*; Dowsey, K.*

Nuclear Instruments and Methods in Physics Research B, 181(1-4), p.27 - 31, 2001/07

https://doi.org/10.1016/S0168-583X(01)00550-X

Times Cited Count：30 Percentile：87.82(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Observation of radiation damage induced by single-ion hits at the heavy ion microbeam system

Kamiya, Tomihiro; Sakai, Takuro; Hirao, Toshio; Oikawa, Masakazu*

Nuclear Instruments and Methods in Physics Research B, 181(1-4), p.280 - 285, 2001/07

https://doi.org/10.1016/S0168-583X(01)00375-5

Times Cited Count：2 Percentile：21.1(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Topics and future plans of ion beam facilities at JAERI

Yokota, Wataru; Arakawa, Kazuo; Okumura, Susumu; Fukuda, Mitsuhiro; Kamiya, Tomihiro; Nakamura, Yoshiteru

Proceedings of 4th International Workshop on Radiation Effects on Semiconductor Devices for Space Application, p.179 - 184, 2000/10

no abstracts in English

Journal Articles

Eyes and fingers touching micro scopic worlds; Development of ion micro beam technology and applications

Kamiya, Tomihiro

Hoshasen Kagaku, 2000(69), p.32 - 36, 2000/03

http://ci.nii.ac.jp/naid/10010163056

no abstracts in English

Journal Articles

Fine single ion hit pattern drawing with heavy ion microbeams

Kamiya, Tomihiro; Sakai, Takuro; *; Hirao, Toshio

Dai-11-Kai Tandemu Kasokuki Oyobi Sono Shuhen Gijutsu No Kenkyukai Hokokushu, p.126 - 128, 1999/01

no abstracts in English

Journal Articles

Development of noise-suppressed detector for single ion hit system

; *; Suda, Tamotsu*; Hirao, Toshio; Kamiya, Tomihiro

JAERI-Conf 97-003, 00(00), p.451 - 453, 1997/00

https://jopss.jaea.go.jp/pdfdata/JAERI-Conf-97-003.pdf

no abstracts in English

Journal Articles

Recent progress in JAERI single ion hit system

; *; Suda, Tamotsu*; Hirao, Toshio; Kamiya, Tomihiro

Nuclear Instruments and Methods in Physics Research B, 130(1-4), p.498 - 502, 1997/00

https://doi.org/10.1016/S0168-583X(97)00240-1

Times Cited Count：15 Percentile：74.12(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Sub-micron microbeam apparatus for high resolution materials analyses

Kamiya, Tomihiro; Suda, Tamotsu*; Tanaka, Ryuichi

Nuclear Instruments and Methods in Physics Research B, 118(1-4), p.447 - 450, 1996/09

https://doi.org/10.1016/0168-583X(96)00251-0

Times Cited Count：34 Percentile：92(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Development of beam pulsing technique for single ion hit system

; *; Hirao, Toshio; Kamiya, Tomihiro

Dai-9-Kai Tandemu Kasokuki Oyobi Sono Shuhen Gijutsu No Kenkyukai Hokokushu, 0, p.60 - 63, 1996/00

no abstracts in English

Journal Articles

High-energy single ion hit technique and its application to local irradiation of living cells

Tanaka, Ryuichi; Kamiya, Tomihiro; Kobayashi, Yasuhiko; Watanabe, Hiroshi

Oyo Butsuri, 65(2), p.168 - 172, 1996/00

http://joi.jlc.jst.go.jp/JST.Journalarchive/oubutsu1932/39.168

no abstracts in English

Journal Articles

Fundamentals and present aspects of iom beam technology,V.1.4; Local area irradiation analysis

Kamiya, Tomihiro

Radioisotopes, 44(8), p.570 - 590, 1995/08

https://doi.org/10.3769/radioisotopes.44.8_570

no abstracts in English

Journal Articles

Beam positioning and single ion hit system in the high energy heavy ion microbeam apparatus

Kamiya, Tomihiro; ; Suda, Tamotsu*; *

BEAMS 1995: Dai-6-Kai Ryushisen No Sentanteki Oyo Gijutsu Ni Kansuru Shimpojiumu Koen Rombunshu, 0, p.127 - 130, 1995/00

no abstracts in English

Journal Articles

Development of high energy single ion hit system conbined with heavy ion microbeam apparatus

Kamiya, Tomihiro; Suda, Tamotsu*; Tanaka, Ryuichi

JAERI TIARA Annual Report 1994, p.226 - 228, 1995/00

https://jopss.jaea.go.jp/pdfdata/JAERI-Review-95-019.pdf

no abstracts in English

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Ionoluminescence analysis of glass scintillators and application to single-ion-hit real-time detection

Development and actual condition of 100MeV class heavy ion microbeam system at JAERI Takasaki, 2

Heavy-ion induced current in MOS structure

Effect of damage on transient current waveform observed in GaAs schottky diode by single ion hit

Development of single-ion hit techniques and their applications at TIARA of JAERI Takasaki

Observation of single-ion induced charge collection in diode by a heavy ion microbeam system

Present status and prospect of microbeams at TIARA

Development of an atomated single cell irradiation system combined with a high-energy heavy ion microbeam system

Observation of radiation damage induced by single-ion hits at the heavy ion microbeam system

Topics and future plans of ion beam facilities at JAERI

Eyes and fingers touching micro scopic worlds; Development of ion micro beam technology and applications

Fine single ion hit pattern drawing with heavy ion microbeams

Development of noise-suppressed detector for single ion hit system

Recent progress in JAERI single ion hit system

Sub-micron microbeam apparatus for high resolution materials analyses

Development of beam pulsing technique for single ion hit system

High-energy single ion hit technique and its application to local irradiation of living cells

Fundamentals and present aspects of iom beam technology,V.1.4; Local area irradiation analysis

Beam positioning and single ion hit system in the high energy heavy ion microbeam apparatus

Development of high energy single ion hit system conbined with heavy ion microbeam apparatus